Concepedia

Kwangrak Kim

KK

4

Publications

114

Citations

4

H-Index

2014

Active since

Affiliations

Seoul National University(Current)

Kwangrak Kim is an author at Seoul National University specializing in applied physics, optical properties, and thin films.

Top concepts

Thin FilmsEngineeringApplied PhysicsOptical PropertiesReflectanceInstrumentationPhysicsMicroscopyCalibrationSpectroscopy

Publications per year

2014–2017

4

Publications

4

Fast Analysis of Film Thickness in Spectroscopic Reflectometry using Direct Phase Extraction

Kwangrak Kim, Soonyang Kwon, Heui Jae Pahk · Current Optics and Photonics · 2017 · 34 citations · Full text

Optical Materials, Engineering, Microscopy +25

Thickness and Surface Measurement of Transparent Thin-Film Layers using White Light Scanning Interferometry Combined with Reflectometry

Taeyong Jo, Kwangrak Kim, Seongryong Kim et al. · Journal of the Optical Society of Korea · 2014 · 33 citations · Full text

Optical Materials, Engineering, Microscopy +18

Volumetric thin film thickness measurement using spectroscopic imaging reflectometer and compensation of reflectance modeling error

Kwangrak Kim, Seongryong Kim, Soonyang Kwon et al. · International Journal of Precision Engineering and Manufacturing · 2014 · 29 citations

Engineering, Optical Properties, Spectroscopy +10

Thickness Measurement of a Transparent Thin Film Using Phase Change in White-Light Phase-Shift Interferometry

Jae-Ho Kim, Kwangrak Kim, Heui Jae Pahk · Current Optics and Photonics · 2017 · 18 citations · Full text

Thin Film Physics, Engineering, Measurement +24

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