R. Bailey

Reliability Properties of Low-Voltage Ferroelectric Capacitors and Memory Arrays

J. Antonio Travieso-Rodríguez, K. Remack, K. Boku et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 107 citations

Reliability, Non-volatile Memory, Electrical Engineering +12

Demonstration of a 4 Mb, high density ferroelectric memory embedded within a 130 nm, 5 LM Cu/FSG logic process

T. S. Moise, Scott R. Summerfelt, H. McAdams et al. · 2003 · 49 citations

Materials Science, Hardware Security, Electrical Engineering +14

Manufacturable High-Density 8 Mbit One Transistor–One Capacitor Embedded Ferroelectric Random Access Memory

Krishna Udayakumar, T. S. Moise, Scott R. Summerfelt et al. · Japanese Journal of Applied Physics · 2008 · 22 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +18

High-Density 8Mb 1T-1C Ferroelectric Random Access Memory Embedded Within a Low-Power 130nm Logic Process

Scott R. Summerfelt, T. S. Moise, Krishna Udayakumar et al. · 2007 · 18 citations

Non-volatile Memory, Engineering, High-density 8Mb +19

Full-Bit Functional, High-Density 8 Mbit One Transistor–One Capacitor Ferroelectric Random Access Memory Embedded within a Low-Power 130 nm Logic Process

Krishna Udayakumar, T. S. Moise, Scott R. Summerfelt et al. · Japanese Journal of Applied Physics · 2007 · 12 citations

Non-volatile Memory, Cmos Baseline, Memory Design +18