O. Engström

Leakage current effects on C-V plots of high-k metal-oxide-semiconductor capacitors

Yi Lu, S. Hall, Liang Z. Tan et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2009 · 26 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +13

Multiparameter admittance spectroscopy for metal-oxide-semiconductor systems

J. Piscator, Bahman Raeissi, O. Engström · Journal of Applied Physics · 2009 · 24 citations

Device Modeling, Conductance Dispersion Curves, Electrical Engineering +14

Laser Scanning Technique for the Detection of Resistivity and Lifetime Inhomogeneities in Semiconductor Devices

O. Engström, Birger Drugge, P.A. Tove · Physica Scripta · 1978 · 21 citations

Engineering, Semiconductor Crystal, Carrier Lifetime +19

Characterization of Traps in the Transition Region at the HfO[sub 2]∕SiO[sub x] Interface by Thermally Stimulated Currents

Bahman Raeissi, J. Piscator, Y. Y. Chen et al. · Journal of The Electrochemical Society · 2011 · 14 citations

A model for internal photoemission at high-<i>k</i> oxide/silicon energy barriers

O. Engström · Journal of Applied Physics · 2012 · 14 citations

Optical Materials, Engineering, Oxide Energy Barrier +16