C.S. Tsai

A next generation CMOS-compatible GaN-on-Si transistors for high efficiency energy systems

King‐Yuen Wong, M.-H. Kwan, F.-W. Yao et al. · 2015 · 73 citations

Bulk Leakage, Electrical Engineering, Gate Trapping +11

Characterization and comparison of high-k metal-insulator-metal (MiM) capacitors in 0.13 μm Cu BEOL for mixed-mode and RF applications

Y. L. Tu, H.L. Lin, Lumen Chao et al. · 2004 · 36 citations

Materials Engineering, Materials Science, Electrical Engineering +13

Edge-Computing-Enabled Deep Learning Approach for Low-Light Satellite Image Enhancement

Trong-An Bui, Pei‐Jun Lee, Chun-Sheng Liang et al. · IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing · 2024 · 33 citations · Full text

Edge Intelligence, Convolutional Neural Network, Machine Vision +15

A leading-edge 0.9µm pixel CMOS image sensor technology with backside illumination: Future challenges for pixel scaling

S.G. Wuu, C.C. Wang, B.-C. Hseih et al. · 2010 · 32 citations

Engineering, Bsi 0.9μM, Pixel Scaling +16

A high-performance, high-density 28nm eDRAM technology with high-K/metal-gate

Kevin Huang, Chin-Ho Chang, K. C. Tu et al. · 2011 · 22 citations

Edram Technology, Non-volatile Memory, Smallest 0.035 +16