Y. L. Tu

A study of the effects of process variables on the properties of PZT films produced by a single-layer sol-gel technique

Y. L. Tu, Steven J. Milne · Journal of Materials Science · 1995 · 80 citations

Materials Engineering, Materials Science, Material Analysis +8

Processing and characterization of Pb(Zr, Ti)O₃films, up to 10 μm thick, produced from a diol sol-gel route

Y. L. Tu, Steven J. Milne · Journal of materials research/Pratt's guide to venture capital sources · 1996 · 77 citations

Materials Science, Material Analysis, Engineering +9

Characterization and comparison of high-k metal-insulator-metal (MiM) capacitors in 0.13 μm Cu BEOL for mixed-mode and RF applications

Y. L. Tu, H.L. Lin, Lumen Chao et al. · 2004 · 36 citations

Materials Engineering, Materials Science, Electrical Engineering +13

A leading-edge 0.9µm pixel CMOS image sensor technology with backside illumination: Future challenges for pixel scaling

S.G. Wuu, C.C. Wang, B.-C. Hseih et al. · 2010 · 32 citations

Engineering, Bsi 0.9μM, Pixel Scaling +16

Characterization of single layer PZT (53/47) films prepared from an air-stable sol-gel route

Y. L. Tu, Steven J. Milne · Journal of materials research/Pratt's guide to venture capital sources · 1995 · 31 citations

Materials Engineering, Materials Science, Material Analysis +7