Julien Couvidat

Identification of GaN Buffer Traps in Microwave Power AlGaN/GaN HEMTs Through Low Frequency S-Parameters Measurements and TCAD-Based Physical Device Simulations

Nandha Kumar Subramani, Julien Couvidat, Ahmad Al Hajjar et al. · IEEE Journal of the Electron Devices Society · 2017 · 98 citations · Full text

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +10

Low-Frequency Drain Noise Characterization and TCAD Physical Simulations of GaN HEMTs: Identification and Analysis of Physical Location of Traps

Nandha Kumar Subramani, Julien Couvidat, Ahmad Al Hajjar et al. · IEEE Electron Device Letters · 2017 · 32 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +12

Low-Frequency Noise Characterization in GaN HEMTs: Investigation of Deep Levels and Their Physical Properties

Nandha Kumar Subramani, Julien Couvidat, Ahmad Al Hajjar et al. · IEEE Electron Device Letters · 2017 · 22 citations

Semiconductors, Wide-bandgap Semiconductor, Electrical Engineering +15

Investigation of Fast and Slow Charge Trapping Mechanisms of GaN/A1GaN HEMTs through Pulsed I-V Measurements and the Associated New Trap Model

Julien Couvidat, Nandha Kumar Subramani, V. Gillet et al. · 2018 · 13 citations

Device Modeling, Fast-emitting Traps, Electrical Engineering +14