M. J. Butcher

Imaging of Friedel Oscillation Patterns of Two-Dimensionally Accumulated Electrons at Epitaxially Grown InAs(111)<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi mathvariant="italic">A</mml:mi></mml:math>Surfaces

Kiyoshi Kanisawa, M. J. Butcher, Hiroshi Yamaguchi et al. · Physical Review Letters · 2001 · 125 citations

Engineering, Materials Science, Physics +17

Realization of Atomically Controlled Dopant Devices in Silicon

F. J. Rueß, Wilson Pok, T. C. G. Reusch et al. · Small · 2007 · 116 citations

Engineering, Materials Engineering, Materials Science +17

Influence of doping density on electronic transport in degenerate Si:P<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>δ</mml:mi></mml:math>-doped layers

Kuan Eng Johnson Goh, L. Oberbeck, M. Y. Simmons et al. · Physical Review B · 2006 · 70 citations

Engineering, Materials Engineering, Materials Science +17

Scanning probe microscopy for silicon device fabrication

M. Y. Simmons, F. J. Rueß, Kuan Eng Johnson Goh et al. · Molecular Simulation · 2005 · 57 citations

Engineering, Materials Engineering, Materials Science +17

Local Density of States in Zero-Dimensional Semiconductor Structures

Kiyoshi Kanisawa, M. J. Butcher, Y. Tokura et al. · Physical Review Letters · 2001 · 46 citations

Natural Sciences, Materials Science, Physics +16