T. C. G. Reusch

Ohm’s Law Survives to the Atomic Scale

Bent Weber, Suddhasatta Mahapatra, Hoon Ryu et al. · Science · 2012 · 330 citations

Realization of Atomically Controlled Dopant Devices in Silicon

F. J. Rueß, Wilson Pok, T. C. G. Reusch et al. · Small · 2007 · 114 citations

Engineering, Microscopy, Nanodevices +24

Atomic-Scale, All Epitaxial In-Plane Gated Donor Quantum Dot in Silicon

Andreas Fuhrer, Martin Füchsle, T. C. G. Reusch et al. · Nano Letters · 2009 · 111 citations

Nanoscale Control, Electrical Engineering, Engineering +13

Scanning probe microscopy for silicon device fabrication

M. Y. Simmons, F. J. Rueß, Kuan Eng Johnson Goh et al. · Molecular Simulation · 2005 · 56 citations

Engineering, Microscopy, Silicon On Insulator +18

Combined Electrical and Optical Analysis of the Efficiency Roll-Off in Phosphorescent Organic Light-Emitting Diodes

Sebastian Wehrmeister, Lars Jäger, Thomas Wehlus et al. · Physical Review Applied · 2015 · 56 citations · Full text

Optical Materials, Efficiency Roll-off, Engineering +18