Noriaki Honma

Ac Surface Photovoltages in Strongly-Inverted Oxidized p-Type Silicon Wafers^*

Chusuke Munakata, Shigeru Nishimatsu, Noriaki Honma et al. · Japanese Journal of Applied Physics · 1984 · 87 citations

Electrical Engineering, Semiconductor Device, Engineering +14

Sample Thickness Dependence of Minority Carrier Lifetimes Measured Using an ac Photovoltaic Method

Noriaki Honma, Chusuke Munakata · Japanese Journal of Applied Physics · 1987 · 37 citations

Engineering, Diffusion Length, Semiconductor Materials +19

A Non-Destructive Method for Measuring Lifetimes for Minority Carriers in Semiconductor Wafers Using Frequency-Dependent ac Photovoltages

Chusuke Munakata, Noriaki Honma, Haruo Itoh · Japanese Journal of Applied Physics · 1983 · 27 citations

Short Wavelength Optic, Optical Materials, Engineering +27

Determination of Surface Charge and Interface Trap Densities in Naturally Oxidized n-Type Si wafers Using ae Surface Photovoltages

Hiromichi Shimizu, K Kinameri, Noriaki Honma et al. · Japanese Journal of Applied Physics · 1987 · 24 citations

Engineering, Optoelectronic Devices, Integrated Circuits +18

Calibration of Minority Carrier Lifetimes Measured with an ac Photovoltaic Method

Noriaki Honma, Chusuke Munakata, Hirofumi Shimizu · Japanese Journal of Applied Physics · 1988 · 23 citations

Engineering, Measurement, Degradation Reaction +17