H.L. Peek - Concepedia

Author

H.L. Peek

Philips (Netherlands)

Also Known As

H Peek, H. L. Peek, H. Peek, H.L. Peek, Hayden A. Peek, Herman L. Peek

Publications

549

Citations

H-Index

Concepts

All Affiliations

Philips (Netherlands)Delft University of Technology

About

H.L. Peek is an author at Philips (Netherlands) specializing in engineering, computer engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	10	427
2	Computer Engineering	5	5	90
3	Applied Physics	2	2	288
4	Computer Science	2	2	32
5	Health Sciences	1	1	12

H.L. Peek

Publications

440

Citations

H-Index

Page 1

	Year	Citations
A Stagnant Layer Model for the Epitaxial Growth of Silicon from Silane in a Horizontal Reactor F. C. Eversteyn, P. J. Severin, C. H. J. v. d. Brekel, Journal of The Electrochemical Society Epitaxial GrowthEngineeringPhysicsFluid MechanicsBetter Uniformity	1970	273
A frame-transfer CCD color imager with vertical antiblooming M. J. H. van de Steeg, H.L. Peek, J. Bakker, IEEE Transactions on Electron Devices EngineeringColor CorrectionImage SensorImage AnalysisCalibration	1985	29
An EEPROM for microprocessors and custom logic R. Cuppens, C.D. Hartgring, J.F. Verwey, IEEE Journal of Solid-State Circuits EngineeringVlsi DesignComputer ArchitectureFormal VerificationHardware Architecture	1985	22
Fowler-Nordheim tunneling in implanted MOS devices D. R. Wolters, H.L. Peek Solid-State Electronics Electrical EngineeringEngineeringTunneling MicroscopyFowler-nordheim TunnelingImplantable Device	1987	21
A 2.2 M pixel FT-CCD imager according to the Eureka HDTV standard Albert Theuwissen, H.L. Peek, M. J. H. van de Steeg, IEEE Transactions on Electron Devices High Conversion EfficiencyImage SensorHigh ResolutionImage AnalysisEngineering	1993	18
Frame transfer CCDs for digital still cameras: concept, design, and evaluation J.T. Bosiers, A.C. Kleimann, H.C. van Kuijk, IEEE Transactions on Electron Devices Frame Transfer CcdsFlexible ModesEngineeringTime-of-flight CameraTime-of-flight Imaging	2002	16
Anomalous behavior of surface leakage currents in heavily doped gated-diodes Fred Hurkx, H.L. Peek, J.W. Slotboom, IEEE Transactions on Electron Devices Device ModelingSemiconductorsElectrical EngineeringSemiconductor TechnologyEngineering	1993	15
A low dark current double membrane poly-Si FT-technology for 2/3 inch 6M pixel CCD imagers H.L. Peek, W.E. Verbugt, H. Heijns	2003	13
A 35-mm format 11 M pixel full-frame CCDfor professional digital still imaging J.T. Bosiers, Bart G. M. Dillen, Cees Draijer, IEEE Transactions on Electron Devices EngineeringM Pixel CcdDevice RequirementsImage SensorImage Analysis	2003	12
High Density Frame Transfer Image Sensor G. A. Beck, M.G. Collet, J. A. A. van Gils, Japanese Journal of Applied Physics Consumer CameraImage SensorImage AnalysisMachine VisionSensors	1983	11

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