Emil V. Jelenković - Concepedia

Author

Emil V. Jelenković

Also Known As

E V Jelenkovic, E. Jelenkovic, E. V. Jelenkovic, E. V. Jelenković, E.V Jelenkovic, E.V. Jelenkovic, E.V. Jelenković, Emil Jelenkovic, Emil V Jelenkovic, Emil V Jelenković

Publications

557

Citations

H-Index

Concepts

All Affiliations

Hong Kong Polytechnic University Chinese University of Hong Kong Hong Kong University of Science and Technology Guangdong University of Technology

About

Emil V. Jelenković is an author at Hong Kong Polytechnic University specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	12	338
2	Applied Physics	10	11	275
3	Materials Engineering	5	5	74
4	Electrical Engineering	2	2	43
5	Chemical Engineering	1	1	16

Emil V. Jelenković

Publications

433

Citations

H-Index

Page 1

	Year	Citations
Memory effect and retention property of Ge nanocrystal embedded Hf-aluminate high-<i>k</i> gate dielectric P F Lee, Xinye Lu, Jiyan Dai, Nanotechnology	2006	63
Enhancement of the machinability of silicon by hydrogen ion implantation for ultra-precision micro-cutting Suet To, Hao Wang, Emil V. Jelenković International Journal of Machine Tools and Manufacture Materials ScienceIon ImplantationEngineeringMicrofabricationHydrogen Ion Implantation	2013	58
Effects of non-amorphizing hydrogen ion implantation on anisotropy in micro cutting of silicon Gaobo Xiao, Suet To, Emil V. Jelenković Journal of Materials Processing Technology Materials ScienceIon ImplantationEngineeringMicrofabricationApplied Physics	2015	56
Properties of crystallized Si1−xGex thin films deposited by sputtering Emil V. Jelenković, Zhenhua Sun, Chee Leung Mak, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceSemiconductorsEngineeringCrystalline DefectsSurface Science	1997	49
Thermally grown ruthenium oxide thin films Emil V. Jelenković Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Materials ScienceSemiconductorsOxide HeterostructuresElectronic DevicesEv Work Function	2004	40
Stability of submicron AlGaN/GaN HEMT devices irradiated by gamma rays S. K. Jha, Emil V. Jelenković, Milić M. Pejović, Microelectronic Engineering Wide-bandgap SemiconductorElectrical EngineeringEngineeringGamma RaysApplied Physics	2008	32
Low temperature doping of poly-SiGe films with boron by co-sputtering Emil V. Jelenković, W. Y. Cheung, I. H. Wilson, Thin Solid Films Materials EngineeringMaterials ScienceEngineeringPhysicsNanoelectronics	2000	23
Physical and electrical properties of sputtered Ru<sub>2</sub>Si<sub>3</sub>/Si structures Emil V. Jelenković, W.Y. Cheung, S. P. Wong Semiconductor Science and Technology	2003	21
Degradation of RuO2 thin films in hydrogen atmosphere at temperatures between 150 and 250 °C Emil V. Jelenković, W.Y. Cheung, S. P. Wong Microelectronics Reliability Materials ScienceEngineeringSurface ScienceApplied PhysicsRuo2 Thin Films	2003	18
Nitridation of hafnium oxide by reactive sputtering Emil V. Jelenković, Wei Liu, Jiyan Dai Microelectronic Engineering Materials EngineeringChemical EngineeringEngineeringCorrosionOxidation Resistance	2005	16

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