F. L. Martı́nez

Optical properties and structure of HfO₂thin films grown by high pressure reactive sputtering

F. L. Martı́nez, M. Toledano-Luque, J.J. Gandı́a et al. · Journal of Physics D Applied Physics · 2007 · 184 citations · Full text

Rapid thermal annealing effects on the structural properties and density of defects in SiO2 and SiNx:H films deposited by electron cyclotron resonance

E. San Andrés, A. del Prado, F. L. Martı́nez et al. · Journal of Applied Physics · 2000 · 109 citations · Full text

Engineering, Ftir Characterization, Electron Cyclotron Resonance +16

Influence of rapid thermal annealing processes on the properties of SiN :H films deposited by the electron cyclotron resonance method

F. L. Martı́nez, I. Mártil, G. González-Dı́az et al. · Journal of Non-Crystalline Solids · 1998 · 43 citations · Full text

Materials Science, Engineering, Physics +5

High-pressure reactively sputtered HfO2: Composition, morphology, and optical properties

M. Toledano-Luque, E. San Andrés, A. del Prado et al. · Journal of Applied Physics · 2007 · 37 citations · Full text

Optical Materials, Engineering, Material Innovation +18

Influence of probe pressure on human skin diffuse reflectance spectroscopy measurements

J. A. Delgado Atencio, Eber Enrique Orozco Guillén, S. Vázquez-Montiel et al. · Optical Memory and Neural Networks · 2009 · 36 citations