Kotaro Ishiji

Development of white and monochromatic X‐ray topography system in SAGA‐LS

Kotaro Ishiji, Seiji Kawado, Yasuharu Hirai · physica status solidi (a) · 2011 · 33 citations

X-ray Spectroscopy, Saga Light Source, Crystalline Defects +15

Determination of observable depth of dislocations in 4H-SiC by X-ray topography in back reflection

Kotaro Ishiji, Seiji Kawado, Yasuharu Hirai et al. · Japanese Journal of Applied Physics · 2017 · 25 citations

Dislocation Visibility, Engineering, Mechanical Engineering +16

Advanced X-ray imaging at beamline 07 of the SAGA Light Source

Akio Yoneyama, Satoshi Takeya, Thet Thet Lwin et al. · Journal of Synchrotron Radiation · 2021 · 20 citations · Full text

Advanced X-ray Imaging, X-ray Spectroscopy, Engineering +18

Thermally Stable and Radiation‐Proof Visible‐Light Photodetectors Made from N‐Doped Diamond

Phongsaphak Sittimart, Shinya Ohmagari, Hitoshi Umezawa et al. · Advanced Optical Materials · 2023 · 20 citations · Full text

Engineering, Conventional Visible‐light Photodetectors, Optoelectronic Devices +18

Nucleation sites of expanded stacking faults detected by <i>in operando</i> x-ray topography analysis to design epitaxial layers for bipolar-degradation-free SiC MOSFETs

Kumiko Konishi, Ryusei Fujita, Keisuke Kobayashi et al. · AIP Advances · 2022 · 17 citations · Full text

Sic Mosfet, Semiconductor Technology, Electrical Engineering +11