Seiji Kawado

Characterization of process-induced lattice distortion in silicon by double-crystal x-ray topography using a curved collimator

Yuki Kudo, K.-Y. Liu, Seiji Kawado et al. · Journal of Applied Physics · 2001 · 52 citations

Natural Sciences, Materials Engineering, Materials Science +17

Construction of topography stations at SPring-8 and first observations

Yoshinori Chikaura, S. Iida, Seiji Kawado et al. · Journal of Physics D Applied Physics · 2001 · 51 citations

Natural Sciences, Materials Science, Crystal Structure +13

Determination of the three-dimensional structure of dislocations in silicon by synchrotron white X-ray topography combined with a topo-tomographic technique

Seiji Kawado, Toshinori Taishi, Satoshi Iida et al. · Journal of Synchrotron Radiation · 2004 · 46 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Synchrotron-radiation X-ray topography of surface strain in large-diameter silicon wafers

Seiji Kawado, S. Iida, S. Yamaguchi et al. · Journal of Synchrotron Radiation · 2002 · 37 citations · Full text

Engineering, Materials Engineering, Materials Science +16

Development of white and monochromatic X‐ray topography system in SAGA‐LS

Kotaro Ishiji, Seiji Kawado, Yasuharu Hirai · physica status solidi (a) · 2011 · 33 citations

Natural Sciences, Materials Engineering, Physics +13