Hervé Leplan

Residual stresses in evaporated silicon dioxide thin films: Correlation with deposition parameters and aging behavior

Hervé Leplan, Bernard Geenen, J. Y. Robic et al. · Journal of Applied Physics · 1995 · 108 citations

Materials Science, Engineering, Deposition Parameters +11

Kinetics of residual stress evolution in evaporated silicon dioxide films exposed to room air

Hervé Leplan, J. Y. Robic, Y. Pauleau · Journal of Applied Physics · 1996 · 62 citations

Materials Science, Engineering, Residual Stress Evolution +12

Residual stress in silicon dioxide thin films produced by ion-assisted deposition

J. Y. Robic, Hervé Leplan, Y. Pauleau et al. · Thin Solid Films · 1996 · 34 citations

Materials Science, Engineering, Ion-assisted Deposition +8

New approach for the critical size of nodular defects: the mechanical connection

Marc Poulingue, Jean Dijon, Michel Ignat et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 21 citations

Engineering, Nodular Defect, Microscopy +16

Freeform optics design, fabrication and testing technologies for Space applications

Roland Geyl, Eric Ruch, Rémi Bourgois et al. · International Conference on Space Optics — ICSO 2018 · 2019 · 21 citations · Full text

Optical Design, Optical Materials, Engineering +19