W. Pamler

Silicon-Nanowire Transistors with Intruded Nickel-Silicide Contacts

W. Weber, Lutz Geelhaar, Andrew Graham et al. · Nano Letters · 2006 · 236 citations

Electrical Engineering, Gate Length, Engineering +10

How do carbon nanotubes fit into the semiconductor roadmap?

Anthony Graham, Georg S. Duesberg, W. Hoenlein et al. · Applied Physics A · 2005 · 190 citations

Materials Science, Nanoscale System, Engineering +7

Impact of copper contamination on the quality of silicon oxides

H. Wendt, H. Cerva, V. Lehmann et al. · Journal of Applied Physics · 1989 · 95 citations

Materials Science, Materials Engineering, Chemical Engineering +15

Three dimensional metallization for vertically integrated circuits

Peter Ramm, D. Bollmann, Rosi Braun et al. · Microelectronic Engineering · 1997 · 90 citations

Materials Science, 3D Ic Architecture, Wafer Scale Processing +8

Performance and failure mechanisms of TiN diffusion barrier layers in submicron devices

A. Kohlhase, M. Mändl, W. Pamler · Journal of Applied Physics · 1989 · 56 citations

Engineering, Contact Degradation, Semiconductor Device +18