Concepedia

Bin Bin Yan

BB

1

Publications

65

Citations

1

H-Index

2011

Active since

Affiliations

Nova Measuring Instruments (Israel)(Current)

Bin Bin Yan is an author at Nova Measuring Instruments (Israel) specializing in microelectronics, microscopy, and instrumentation.

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Publications per year

2011–2011

1

Publications

1

A holistic metrology approach: hybrid metrology utilizing scatterometry, CD-AFM, and CD-SEM

Alok Vaid, Bin Bin Yan, Yun Tao Jiang et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2011 · 65 citations

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