N. Sukhaseum

Effects of Ion Species on SEB Failure Voltage of Power DMOSFET

Sandra Liu, Jean‐Marie Lauenstein, Véronique Ferlet-Cavrois et al. · IEEE Transactions on Nuclear Science · 2011 · 34 citations

Electrical Engineering, Engineering, High Voltage Engineering +12

Physical Mechanisms Inducing Electron Single-Event Upset

Pablo Caron, C. Inguimbert, L. Artola et al. · IEEE Transactions on Nuclear Science · 2018 · 33 citations · Full text

Hardware Security, Hardware Trojan, Electrical Engineering +15

Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology

A. Samaras, Pierre Pourrouquet, N. Sukhaseum et al. · IEEE Transactions on Nuclear Science · 2014 · 28 citations

Engineering, Vlsi Design, Computer Architecture +22

Evaluation on Protective Single Event Burnout Test Method for Power DMOSFETs

Sandra Liu, R. Marec, Phillip Sherman et al. · IEEE Transactions on Nuclear Science · 2012 · 13 citations

Electrical Engineering, Reliability Engineering, Engineering +11

Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices

J. Guillermin, N. Sukhaseum, A. Varotsou et al. · 2016 · 12 citations

Lot-to-lot Variability Study, Engineering, Radiation Hardness Assurance +20