Concepedia

V. Blaschke

VB

Statistics

Publications

15

Citations

813

H-Index

12

Active since

2000

Affiliations

The University of Texas at Austin(Current)

Conexant (United States)

Skyworks Solutions (United States)

Karlsruhe Institute of Technology

Texas Instruments (United States)

V. Blaschke is an author at The University of Texas at Austin specializing in electrical engineering, engineering, and microelectronics.

Publications per year

2000–2013

15

Publications

15

Electromigration reliability issues in dual-damascene Cu interconnections

E.T. Ogawa, Ki‐Don Lee, V. Blaschke et al. · IEEE Transactions on Reliability · 2002 · 274 citations

, , +17

Permittivity characterization of low-k thin films from transmission-line measurements

Michael D. Janezic, Dylan F. Williams, V. Blaschke et al. · IEEE Transactions on Microwave Theory and Techniques · 2003 · 95 citations

, , +17

Electromigration critical length effect in Cu/oxide dual-damascene interconnects

Ki-Don Lee, Ennis T. Ogawa, Hideki Matsuhashi et al. · Applied Physics Letters · 2001 · 86 citations

, , +17

Direct observation of a critical length effect in dual-damascene Cu/oxide interconnects

Ennis T. Ogawa, Alexander J. Bierwag, Ki-Don Lee et al. · Applied Physics Letters · 2001 · 68 citations

, , +17

Statistics of electromigration early failures in Cu/oxide dual-damascene interconnects

E.T. Ogawa, K.-D. Lee, Hideki Matsuhashi et al. · 2002 · 51 citations

, , +17

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