Concepedia

Tom C. Lee

TC

Statistics

Publications

2

Citations

313

H-Index

2

Active since

2003

Affiliations

IBM (United States)(Current)

Tom C. Lee is an author at IBM (United States) specializing in electrical engineering, materials science, and interconnect technology.

Publications per year

2003–2009

2

Publications

2

Reliability challenges for copper interconnects

Baozhen Li, Timothy D. Sullivan, Tom C. Lee et al. · Microelectronics Reliability · 2003 · 285 citations

Engineering, Electrical Engineering, Materials Science +14

Reliability challenges for advanced copper interconnects: Electromigration and time-dependent dielectric breakdown (TDDB)

J. Gambino, Tom C. Lee, Fen Chen et al. · 2009 · 28 citations

Engineering, Electrical Engineering, Materials Science +17

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