Statistics
Publications
2
Citations
45
H-Index
2
Active since
2000
Affiliations
Micron (United States)(Current)
Kari Noehring is an author at Micron (United States) specializing in surface science, applied physics, and instrumentation.
Publications per year
2000–2008
2
2
Thin-film metrology of silicon-on-insulator materials
Stefan Zollner, T.-C. Lee, Kari Noehring et al. · Applied Physics Letters · 2000 · 14 citations
Engineering, Optical Testing, Thin Film Process Technology +22
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