N. A. Tal’nishnih

Degradation-induced low frequency noise and deep traps in GaN/InGaN near-UV LEDs

In‐Hwan Lee, A. Y. Polyakov, Sung-Min Hwang et al. · Applied Physics Letters · 2017 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

Deep trap analysis in green light emitting diodes: Problems and solutions

A. Y. Polyakov, N. M. Shmidt, N. B. Smirnov et al. · Journal of Applied Physics · 2019 · 17 citations

Engineering, Electrical Engineering, Materials Science +17

Electron irradiation of near‐UV GaN/InGaN light emitting diodes

In‐Hwan Lee, A. Y. Polyakov, N. B. Smirnov et al. · physica status solidi (a) · 2017 · 15 citations

Engineering, Electrical Engineering, Materials Science +17

Defect States Induced in GaN-Based Green Light Emitting Diodes by Electron Irradiation

A. Y. Polyakov, N. M. Shmidt, N. B. Smirnov et al. · ECS Journal of Solid State Science and Technology · 2018 · 15 citations

Engineering, Electrical Engineering, Materials Science +17