Keith Fogel

Layer-Resolved Graphene Transfer via Engineered Strain Layers

Jeehwan Kim, Hongsik Park, J. B. Hannon et al. · Science · 2013 · 226 citations

Natural Sciences, Materials Engineering, Materials Science +11

Kerf-Less Removal of Si, Ge, and III–V Layers by Controlled Spalling to Enable Low-Cost PV Technologies

Stephen W. Bedell, Davood Shahrjerdi, Bahman Hekmatshoar et al. · IEEE Journal of Photovoltaics · 2012 · 174 citations

Engineering, Materials Engineering, Materials Science +17

High-Performance $\hbox{In}_{0.7}\hbox{Ga}_{0.3}\hbox{As}$ -Channel MOSFETs With High-$\kappa$ Gate Dielectrics and $\alpha$-Si Passivation

Yi Sun, E. Kiewra, J. P. de Souza et al. · IEEE Electron Device Letters · 2008 · 107 citations

Engineering, Electrical Engineering, Materials Science +14

Layer transfer by controlled spalling

Stephen W. Bedell, Keith Fogel, Paul Lauro et al. · Journal of Physics D Applied Physics · 2013 · 105 citations · Full text

Engineering, Materials Engineering, Materials Science +17

High-efficiency thin-film InGaP/InGaAs/Ge tandem solar cells enabled by controlled spalling technology

Davood Shahrjerdi, Stephen W. Bedell, Chris Ebert et al. · Applied Physics Letters · 2012 · 101 citations

Engineering, Electrical Engineering, Materials Science +17