N.V. Arvind

A case study of ir-drop in structured at-speed testing

J. Saxena, Kenneth M. Butler, Vinay Jayaram et al. · 2004 · 403 citations

Engineering, Computer Engineering, Electrical Engineering +14

Within-Die Gate Delay Variability Measurement Using Reconfigurable Ring Oscillator

Bishnu Prasad Das, Bharadwaj Amrutur, H. S. Jamadagni et al. · IEEE Transactions on Semiconductor Manufacturing · 2009 · 46 citations

Engineering, Computer Engineering, Electrical Engineering +17

Within-die gate delay variability measurement using re-configurable ring oscillator

Bishnu Prasad Das, Bharadwaj Amrutur, H. S. Jamadagni et al. · 2008 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +15

Voltage and Temperature-Aware SSTA Using Neural Network Delay Model

Bishnu Prasad Das, Bharadwaj Amrutur, H. S. Jamadagni et al. · IEEE Transactions on Semiconductor Manufacturing · 2011 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +17