J.C. Chen

Suppression of boron penetration in p/sup +/ polysilicon gate P-MOSFETs using low-temperature gate-oxide N/sub 2/O anneal

Z.J. Ma, J.C. Chen, Z.H. Liu et al. · IEEE Electron Device Letters · 1994 · 86 citations

Engineering, Electrical Engineering, Materials Science +17

Investigation of interconnect capacitance characterization using charge-based capacitance measurement (CBCM) technique and three-dimensional simulation

Dennis Sylvester, J.C. Chen, Chenming Hu · IEEE Journal of Solid-State Circuits · 1998 · 81 citations

Engineering, Computer Engineering, Electrical Engineering +17

A simple method for on-chip, sub-femto Farad interconnect capacitance measurement

Bruce McGaughy, J.C. Chen, Dennis Sylvester et al. · IEEE Electron Device Letters · 1997 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +17

Investigation of interconnect capacitance characterization using charge-based capacitance measurement (CBCM) technique and 3-D simulation

Dennis Sylvester, J.C. Chen, Chen Hu · 2002 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +17