F. W. Saris

Angle resolved detection of charged particles with a novel type toroidal electrostatic analyser

R.G. Smeenk, R. M. Tromp, Holger Kersten et al. · Nuclear Instruments and Methods in Physics Research · 1982 · 183 citations

Instrument Science, Physics, Analytical Instrumentation +1

Ion beam crystallography of silicon surfaces II. Si(100)-(2 × 1)

R. M. Tromp, R.G. Smeenk, F. W. Saris et al. · Surface Science · 1983 · 173 citations

Materials Science, Ion Beam Crystallography, Engineering +7

Surface structure analysis by means of Rutherford scattering: Methods to study surface relaxation

W.C. Turkenburg, W. Soszka, F. W. Saris et al. · Nuclear Instruments and Methods · 1976 · 139 citations

Materials Science, Surface Characterization, Surface Structure Analysis +9

Stability of amorphous Cu/Ta and Cu/W alloys

M. Nastasi, F. W. Saris, L. S. Hung et al. · Journal of Applied Physics · 1985 · 138 citations

Materials Science, Materials Engineering, High Temperature Materials +13

Pre-amorphization damage in ion-implanted silicon

R.J. Schreutelkamp, J. S. Custer, J.R. Liefting et al. · Materials Science Reports · 1991 · 134 citations

Ion Implantation, Applied Physics, Amorphous Solid +2