J. Kircher - Concepedia

Author

J. Kircher

Max Planck Institute for Solid State Research

Also Known As

J Bertino, J. Kircher, J.A. Kircher, Jens Kircher, R. Henn

Publications

1.3K

Citations

H-Index

Concepts

All Affiliations

Max Planck Institute for Solid State Research Max Planck Society Lawrence Berkeley National Laboratory Argonne National Laboratory

About

J. Kircher is an author at Max Planck Institute for Solid State Research specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	17	849
2	Applied Physics	13	15	642
3	Natural Sciences	6	6	246
4	Chemistry	3	3	91
5	Education	1	1	10

J. Kircher

Publications

883

Citations

H-Index

Page 1

	Year	Citations
Plasmas as antennas: Theory, experiment and applications J. H. Harris, Nivetha Martin, David Thorncraft, Physics of Plasmas RadarEngineeringRadio EngineeringPhysicsRadio Frequency	2000	191
The low-temperature infrared optical functions of SrTiO3 determined by reflectance spectroscopy and spectroscopic ellipsometry K. Kamarás, K.-L. Barth, F. Keilmann, Journal of Applied Physics Superconducting MaterialOptical MaterialsEngineeringSpectroscopic PropertyOptical Properties	1995	127
Elasto-optical constants of Si P. Etchegoin, J. Kircher, M. Cardona Physical review. B, Condensed matter Optical MaterialsEngineeringRotating-analyzer EllipsometrySilicon On InsulatorPiezo-optical Tensor	1993	89
Temperature dependence of the dielectric function and the interband critical-point parameters of GaP Stefan Zollner, M. Garriga, J. Kircher, Physical review. B, Condensed matter EngineeringDielectric Function \EnsuremathTemperature DependenceElectronic StructureElectromagnetic Compatibility	1993	77
Piezo-optics of GaAs P. Etchegoin, J. Kircher, M. Cardona, Physical review. B, Condensed matter Spectral TheoryPhotonicsPiezoreflectance DataOptical MaterialsEngineering	1992	62
Piezo-optical response of Ge in the visible–uv range P. Etchegoin, J. Kircher, M. Cardona, Physical review. B, Condensed matter Optical MaterialsGe CrystalsEngineeringOptical TestingRotating-analyzer Ellipsometry	1992	54
Far-infrared ellipsometry using synchrotron radiation J. Kircher, R. Henn, M. Cardona, Journal of the Optical Society of America B Optical MaterialsEngineeringSynchrotron Far-infrared EllipsometerOptoelectronic DevicesOptical Characterization	1997	46
The growth of (110) YBaCuO thin films and their characterization by optical methods H.‐U. Habermeier, A.A.C.S. Lourenço, B. Friedl, Solid State Communications	1991	34
Optical properties of μ<i>c</i>-Si:H/α-Si:H layered structures: Influence of the hydrogen bonds, crystallite size, and thickness S. Boultadakis, S. Logothetidis, S. Ves, Journal of Applied Physics Optical MaterialsEngineeringOptoelectronic DevicesThin Film Process TechnologyChemistry	1993	34
Infrared optical response of YBa2Cu3O7 and PrBa2Cu3O7 An ellipsometric study J. Humlı́ček, J. Kircher, H.‐U. Habermeier, Physica C Superconductivity Optical MaterialsEngineeringInfrared SensorOptical PropertiesSpectroscopy	1992	32

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