M. Shiozu is an author at Fujitsu (Japan) specializing in materials science, mechanics of materials, and microelectronics.
Top concepts
EngineeringApplied PhysicsMaterial ScienceMicroelectronicsElectronic PackagingElectrical EngineeringMechanics Of MaterialsPlasticityMicrostructureNanoelectronics
Publications per year
2007–2008
2
2
Stress migration phenomenon in narrow copper interconnects
Takashi Suzuki, T. Nakamura, Y. Mizushima et al. · Journal of Applied Physics · 2007 · 18 citations · Full text
Engineering, Severe Plastic Deformation, Residual Stress +17
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1–2 of 2