Min-Kyu Jeong

Analysis of Random Telegraph Noise and low frequency noise properties in 3-d stacked NAND flash memory with tube-type poly-Si channel structure

Min-Kyu Jeong, Sung-Min Joe, Chang-Su Seo et al. · 2012 · 36 citations

Engineering, Computer Engineering, Electrical Engineering +17

Characterization of traps in 3-D stacked NAND flash memory devices with tube-type poly-Si channel structure

Min-Kyu Jeong, Sung-Min Joe, Bong-Su Jo et al. · 2012 · 22 citations

Engineering, Computer Engineering, Electrical Engineering +17

Effect of traps on transient bit-line current behavior in word-line stacked nand flash memory with poly-Si body

Ho-Jung Kang, Min-Kyu Jeong, Sung-Min Joe et al. · 2014 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +17

Preparation of a water-soluble fullerene [C70] under ultrasonic irradiation

Weon-Bae Ko, Young-Hwan Park, Min-Kyu Jeong · Ultrasonics · 2006 · 13 citations

Natural Sciences, Chemistry, Materials Science +8

The Effect of Adjacent Bit-Line Cell Interference on Random Telegraph Noise in nand Flash Memory Cell Strings

Sung-Min Joe, Min-Kyu Jeong, Bong-Su Jo et al. · IEEE Transactions on Electron Devices · 2012 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +13