Daewoong An

Using Wafer Map Features to Better Predict Die-Level Failures in Final Test

Seokho Kang, Sungzoon Cho, Daewoong An et al. · IEEE Transactions on Semiconductor Manufacturing · 2015 · 55 citations

A semiconductor yields prediction using stepwise support vector machine

Daewoong An, Hyo-Heon Ko, Turghun Gulambar et al. · 2009 · 21 citations

Engineering, Machine Learning, Yield Prediction +17

Data Mining Approaches for Packaging Yield Prediction in the Post-fabrication Process

Seung Hwan Park, Cheong-Sool Park, Jun Seok Kim et al. · 2013 · 15 citations

Engineering, Industrial Engineering, Mechanical Engineering +17

Incorporating Virtual Metrology Into Failure Prediction

Seokho Kang, Daewoong An, Jaeyoung Rim · IEEE Transactions on Semiconductor Manufacturing · 2019 · 11 citations

Artificial Intelligence, Engineering, Machine Learning +22