2
Publications
87
Citations
2
H-Index
2004
Active since
C. Lee is an author at ET Enterprises (United Kingdom).
Publications per year
2004–2005
2
2
Effects of AlGaN/GaN HEMT structure on RF reliability
C. Lee, L. Witkowski, H.Q. Tserng et al. · Electronics Letters · 2005 · 62 citations
Rows per page
1–2 of 2