Anup N. Ramamurthi

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Publications

Citations

137

H-Index

Active since

2000

Affiliations

The University of Texas at Austin(Current)

Anup N. Ramamurthi is an author at The University of Texas at Austin specializing in electromigration, semiconductor devices, and semiconductor reliability.

Publications per year

2000–2002

Publications

Direct observation of a critical length effect in dual-damascene Cu/oxide interconnects

Ennis T. Ogawa, Alexander J. Bierwag, Ki-Don Lee et al. · Applied Physics Letters · 2001 · 68 citations

Engineering, Electrical Engineering, Materials Science +17

Statistics of electromigration early failures in Cu/oxide dual-damascene interconnects

E.T. Ogawa, K.-D. Lee, Hideki Matsuhashi et al. · 2002 · 51 citations

Engineering, Electrical Engineering, Materials Science +17

Electromigration Reliability of Dual-Damascene Cu/Oxide Interconnects

Ennis T. Ogawa, V. Blaschke, Alex Bierwag et al. · MRS Proceedings · 2000 · 18 citations

Engineering, Electrical Engineering, Materials Engineering +14

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