Geerten Kramer

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Active since

2009

Affiliations

Netherlands Organisation for Applied Scientific Research(Current)

Delft University of Technology

Geerten Kramer is an author at Netherlands Organisation for Applied Scientific Research specializing in instrumentation, nanometer-scale metrology, and scanning probe microscopy.

Publications per year

2009–2015

Publications

Parallel, miniaturized scanning probe microscope for defect inspection and review

Hamed Sadeghian, T.C. van den Dool, Will Crowcombe et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2014 · 14 citations · Full text

Engineering, Manufacturing Engineering, Instrumentation +12

Development of a detachable high speed miniature scanning probe microscope for large area substrates inspection

Hamed Sadeghian, R.W. Herfst, Jasper Winters et al. · Review of Scientific Instruments · 2015 · 14 citations

Engineering, Mechanical Engineering, Mechatronics Engineering +14

Nanometer level freeform surface measurements with the NANOMEFOS non-contact measurement machine

R. Henselmans, L.A. Cacace, Geerten Kramer et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2009 · 10 citations · Full text

Engineering, Mechatronics Engineering, Instrumentation +15

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