Kostas Amberiadis

Carrier distribution and low-field resistance in short n⁺-n^--n⁺and n⁺-p^--n⁺structures

A. van der Ziel, M. S. Shur, Kwyro Lee et al. · IEEE Transactions on Electron Devices · 1983 · 34 citations

Applied Mathematical Modelling, Carrier Distribution, Engineering +12

Noise phenomena associated with dislocations in bipolar transistors

M. Mihaila, Kostas Amberiadis · Solid-State Electronics · 1983 · 23 citations

Dislocation Interaction, Engineering, Bias Temperature Instability +4

, g-r and burst noise induced by emitter-edge dislocations in bipolar transistors

M. Mihaila, Kostas Amberiadis, A. van der Ziel · Solid-State Electronics · 1984 · 20 citations

Electrical Engineering, Engineering, Dislocation Interaction +7

Oscillator with odd- symmetrical characteristics eliminates low-frequency noise sidebands

H. Chen, A. van der Ziel, Kostas Amberiadis · IEEE Transactions on Circuits and Systems · 1984 · 16 citations

Engineering, Radio Frequency, Physics +10

Effect of trap distribution on g-r noise spectra

Kwyro Lee, Kostas Amberiadis, A. van der Ziel · Solid-State Electronics · 1982 · 16 citations

Trap Distribution, Engineering, Spectroscopy +4