H. Hengster

Testability properties of local circuit transformations with respect to the robust path-delay-fault model

H. Hengster, Rolf Drechsler, Bernd Becker · 2002 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +10

Testability of 2-Level AND/EXOR Circuits

Rolf Drechsler, H. Hengster, Horst Schäfer et al. · Journal of Electronic Testing · 1999 · 17 citations

Engineering, Computer Engineering, Computer Science +14

On local transformations and path delay fault testability

H. Hengster, Rolf Drechsler, Bernd Becker · Journal of Electronic Testing · 1995 · 12 citations

Engineering, Computer Engineering, Computer Science +13

A scalable BIST architecture for delay faults

Martin Keim, Ilia Polian, H. Hengster et al. · 2003 · 12 citations

Engineering, Computer Engineering, Computer Science +14

AND/EXOR-based synthesis of testable KFDD-circuits with small depth

H. Hengster, Rolf Drechsler, S. Eckrich et al. · 2002 · 11 citations

Engineering, Computer Engineering, Computer Science +17