Concepedia

S. Sugiura

SS

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Publications

3

Citations

291

H-Index

3

Active since

1987

Affiliations

Toshiba (Japan)(Current)

S. Sugiura is an author at Toshiba (Japan) specializing in device reliability, semiconductor devices, and electrical engineering.

Publications per year

1987–2002

3

Publications

3

On the retention time distribution of dynamic random access memory (DRAM)

T. Hamamoto, S. Sugiura, Seiji Sawada · IEEE Transactions on Electron Devices · 1998 · 247 citations

, , +16

Well concentration: a novel scaling limitation factor derived from DRAM retention time and its modeling

T. Hamamoto, S. Sugiura, Seiji Sawada · 2002 · 31 citations

, , +17

Degradation in Quality of Very Thin Gate Oxide by Arsenic Ion Implantation

S. Sugiura, S. Shinozaki · Journal of The Electrochemical Society · 1987 · 13 citations

, , +17

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