New CsI/a-Si 17" x 17" x-ray flat-panel detector provides superior detectivity and immediate direct digital output for general radiography systems

C. Chaussat, J. Chabbal, Thierry Ducourant, +3

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

EngineeringNew 17New Csi/a-si 17General RadiographyX-ray Imaging +18

<title>Amorphous silicon x-ray image sensor</title>

J. Chabbal, C. Chaussat, Thierry Ducourant, +10

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

EngineeringIntegrated CircuitsImage SensorX-ray FluorescenceX-ray Imaging +18

Amorphous silicon X-ray detectors

M. Hoheisel, M. Arquès, J. Chabbal, +6

Journal of Non-Crystalline Solids

EngineeringPhysicsApplied PhysicsInstrumentationSynchrotron Radiation +2

<title>Design and performance of a high-quality cardiac flat detector</title>

Falko Busse, Walter Ruetten, Bernhard Sandkamp, +3

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

EngineeringBiomedical EngineeringMedical InstrumentationCt ScanPhoton-counting Computed Tomography +15

3 GHz, 150 mW, 4 bit GaAs Analogue to Digital Converter

Thierry Ducourant, Michel Binet, Jean-Claude Baelde, +2

Electrical EngineeringGaas ChipEngineeringAnalog-to-digital ConverterHigh Sensitivity +11

Conduction and 1/<i>f</i> noise analysis in amorphous silicon thin-film transistors

M. Valenza, Clarisse Pétua Bosman Barros, M. Dumas, +4

Journal of Applied Physics

Device ModelingSemiconductor TechnologyElectrical EngineeringEngineeringMobility Fluctuations +8

A 5 bit, 2.2 Gs/s monolithic A/D converter with gigahertz bandwidth, and 6 bit A/D converter system

Thierry Ducourant, D. Meignant, P. Bertsch, +1

Electrical EngineeringGaas ChipEngineeringGigahertz BandwidthElectronic Engineering +10

&lt;title&gt;Image quality of a large-area dynamic flat detector: comparison with a state-of-the-art II/TV system&lt;/title&gt;

Tom J. C. Bruijns, Raoul J. M. Bastiaens, Bart Hoornaert, +7

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Flat DetectorEngineeringMeasurementClinical Image QualityTrixell Detector +23

Optimization of key building blocks for a large-area radiographic and fluoroscopic dynamic digital x-ray detector based on a-Si:H/CsI:Tl flat panel technology

Thierry Ducourant, Marc Michel, Gerard Vieux, +5

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Key Building BlocksEngineeringLarge-area RadiographicKey Design OptimizationsImage Sensor +15

Detective quantum efficiency of an x-ray image intensifier chain as a benchmark for amorphous silicon flat-panal detectors

Andreas Koch, Jean-Marie Macherel, Thibaut Wirth, +5

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

EngineeringIntegrated CircuitsBiomedical EngineeringX-ray FluorescenceX-ray Imaging +19