Statistics
Publications
27
Citations
1.1K
H-Index
18
Active since
1983
M. Hoheisel is an author at Siemens (Germany) specializing in materials science, semiconductor materials, and radiology.
Publications per year
1983–2009
27
27
Inverse geometry for grating-based x-ray phase-contrast imaging
Tilman Donath, Michael Chabior, Franz Pfeiffer et al. · Journal of Applied Physics · 2009 · 177 citations · Full text
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