Concepedia

Author

Walter Ruetten

Philips (Netherlands)

Also Known As

W. Ruetten, Walter Ruetten

16

Publications

380

Citations

8

H-Index

55

Concepts

All Affiliations

Philips (Netherlands)Philips (Germany)Philips (Finland)Holst Centre (Netherlands)Siemens (Germany)
WR

About

Walter Ruetten is an author at Philips (Netherlands) specializing in engineering, health sciences, and radiology.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

7

7

287

2

Health Sciences

6

6

267

3

Applied Physics

3

3

140

4

Biomedical Engineering

2

2

87

5

Chemical Engineering

1

1

94

Walter Ruetten

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8

Publications

352

Citations

8

H-Index

YearCitations

X-Ray Detector-on-Plastic With High Sensitivity Using Low Cost, Solution-Processed Organic Photodiodes

Gerwin H. Gelinck, Abhishek Kumar, Date Moet,

IEEE Transactions on Electron Devices

2015

94

Curved digital X-ray detectors

Albert J. J. M. van Breemen, M.E. Simon, O. Tousignant,

npj Flexible Electronics

2020

65

PET/MRI insert using digital SiPMs: Investigation of MR-compatibility

Jakob Wehner, Bjoern Weissler, Peter Michael Dueppenbecker,

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

2013

58

Counting and Integrating Readout for Direct Conversion X-ray Imaging: Concept, Realization and First Prototype Measurements

E. Kraft, P. Fischer, M. Karagounis,

IEEE Transactions on Nuclear Science

2007

47

<title>Design and performance of a high-quality cardiac flat detector</title>

Falko Busse, Walter Ruetten, Bernhard Sandkamp,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2002

29

Dynamic x-ray imaging system based on an amorphous silicon thin-film array

Norbert Jung, P. L. Alving, Falko Busse,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

1998

26

<title>Investigation of highly scattering media using near-infrared continuous wave tunable semiconductor laser</title>

Udo Haberland, Walter Ruetten, Vladimír Blažek,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

1995

20

Methodology to measure fundamental performance parameters of x-ray detectors

Falko Busse, Walter Ruetten, Hans-Aloys Wischmann,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2001

13

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