C. B. Carter

Direct TEM determination of intrinsic and extrinsic stacking fault energies of silicon

H. Föll, C. B. Carter · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1979 · 85 citations

Engineering, Silicon On Insulator, Defect Tolerance +16

Antiphase boundaries in GaAs

N.-H. Cho, Bruno C. De Cooman, C. B. Carter et al. · Applied Physics Letters · 1985 · 70 citations

Semiconductors, Ii-vi Semiconductor, Engineering +9

Electron diffraction and microscopy studies of the structure of grain boundaries in silicon

C. B. Carter, H. Föll, D. G. Ast et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1981 · 59 citations

Real Diffraction Spots, Engineering, Electron Diffraction +17

Direct observation of ordering in (GaIn) P

S. McKernan, Bruno C. De Cooman, C. B. Carter et al. · Journal of materials research/Pratt's guide to venture capital sources · 1988 · 51 citations

Order Theory, Direct Observation, Sorting Algorithm +3

Faulted dipoles in germanium A high-resolution transmission electron microscopy study

S. W. Chiang, C. B. Carter, D. L. Kohlstedt · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1980 · 50 citations

Engineering, Microscopy, Electron Diffraction +18