Statistics
Publications
4
Citations
501
H-Index
4
Active since
2005
Affiliations
Reto Pfeiffer is an author at Swiss Center for Electronics and Microtechnology (Switzerland) specializing in engineering, electrical engineering, and materials science.
Publications per year
2005–2012
4
4
Lifetime Warranty Testing of Crystalline Silicon Modules for Potential-Induced Degradation
H. Nagel, Reto Pfeiffer, A. Raykov et al. · EU PVSEC · 2012 · 12 citations · Full text
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