Statistics
Publications
1
Citations
12
H-Index
1
Active since
2012
A. Raykov is an author specializing in degradation testing, lifetime testing, and device characterization.
Publications per year
2012–2012
1
1
Lifetime Warranty Testing of Crystalline Silicon Modules for Potential-Induced Degradation
H. Nagel, Reto Pfeiffer, A. Raykov et al. · EU PVSEC · 2012 · 12 citations · Full text
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