Abhishek Koneru

Impact of Electrostatic Coupling and Wafer-Bonding Defects on Delay Testing of Monolithic 3D Integrated Circuits

Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty · ACM Journal on Emerging Technologies in Computing Systems · 2017 · 44 citations

M3d Integration, Engineering, Monolithic 3D +17

Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress

Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2016 · 43 citations

Engineering, Aging, Vlsi Design +21

Design automation and testing of monolithic 3D ICs: Opportunities, challenges, and solutions: (Invited paper)

Kyungwook Chang, Abhishek Koneru, Krishnendu Chakrabarty et al. · 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) · 2017 · 35 citations

Engineering, New Device, Electronic Design Automation +19

A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits

Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2018 · 25 citations

Engineering, M3d Ics, Computer Architecture +17

Impact of wafer-bonding defects on Monolithic 3D integrated circuits

Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty · 2016 · 23 citations

M3d Integration, Engineering, Computer Architecture +17