Arunkumar Vijayan

Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress

Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2016 · 43 citations

Engineering, Aging, Vlsi Design +21

Fine-grained aging prediction based on the monitoring of run-time stress using DfT infrastructure

Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty et al. · 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) · 2015 · 14 citations

Real-time Monitoring, Engineering, Aging +29

Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure

Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty et al. · International Conference on Computer Aided Design · 2015 · 13 citations

Real-time Monitoring, Engineering, Aging +29

Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores

Arunkumar Vijayan, Saman Kiamehr, Mojtaba Ebrahimi et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2017 · 13 citations

Flip-flop Sps, Engineering, Machine Learning +22

Re-using BIST for circuit aging monitoring

Farshad Firouzi, Fangming Ye, Arunkumar Vijayan et al. · 2015 · 12 citations

Engineering, Measurement, Computer Architecture +18