Sukeshwar Kannan

Impact of Electrostatic Coupling and Wafer-Bonding Defects on Delay Testing of Monolithic 3D Integrated Circuits

Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty · ACM Journal on Emerging Technologies in Computing Systems · 2017 · 44 citations

M3d Integration, Engineering, Monolithic 3D +17

Development of novel carbon nanotube TSV technology

Anurag Gupta, Sukeshwar Kannan, Bruce C. Kim et al. · 2010 · 30 citations

Engineering, Interconnect (Integrated Circuits), Carbon-based Material +20

Analysis of carbon nanotube based Through Silicon Vias

Sukeshwar Kannan, Anurag Gupta, Bruce C. Kim et al. · 2010 · 28 citations

Materials Science, Graphene Nanomeshes, Electrical Engineering +15

SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors

Mehdi Sadi, Sukeshwar Kannan, LeRoy Winemberg et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2016 · 26 citations

Speed Binning, Engineering, Vlsi Design +20

A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits

Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2018 · 25 citations

Engineering, M3d Ics, Computer Architecture +17