C.J. Sun

Temperature dependence of hot-electron degradation in bipolar transistors

Chenling Huang, T.A. Grotjohn, C.J. Sun et al. · IEEE Transactions on Electron Devices · 1993 · 23 citations

Engineering, Electrical Engineering, Materials Science +16

Hot-electron-induced degradation and post-stress recovery of bipolar transistor gain and noise characteristics

C.J. Sun, D.K. Reinhard, T.A. Grotjohn et al. · IEEE Transactions on Electron Devices · 1992 · 21 citations

Engineering, Electrical Engineering, Microelectronics +16

Temperature dependence and post-stress recovery of hot electron degradation effects in bipolar transistors

Chenling Huang, C.J. Sun, T.A. Grotjohn et al. · 2002 · 14 citations

Engineering, Electrical Engineering, Materials Science +17