J. C. Galzerani

Comparative Raman studies of cubic and hexagonal GaN epitaxial layers

A. Tabata, R. Enderlein, J. R. Leite et al. · Journal of Applied Physics · 1996 · 93 citations · Full text

Materials Science, Hexagonal Gan, Wide-bandgap Semiconductor +12

Crystalline quality and phase purity of CVD diamond films studied by Raman spectroscopy

W. Fortunato, Adenilson J. Chiquito, J. C. Galzerani et al. · Journal of Materials Science · 2007 · 72 citations

Crystalline Quality, Materials Science, Diamond-like Carbon +6

Raman study of interface modes subjected to strain in InAs/GaAs self-assembled quantum dots

Yu. A. Pusep, G. Zanelatto, S.W. da Silva et al. · Physical review. B, Condensed matter · 1998 · 52 citations

Materials Science, Ii-vi Semiconductor, Engineering +14

Capacitance-voltage profile in a structure with negative differential capacitance caused by the presence of InAs/GaAs self-assembled quantum dots

Adenilson J. Chiquito, Yu. A. Pusep, S. Mergulhão et al. · Physical review. B, Condensed matter · 2000 · 49 citations

Capacitance-voltage Profile, Categoryquantum Electronics, Electrical Engineering +14

Structural and optical analysis of GaAsP/GaP core-shell nanowires

Parsian K. Mohseni, Ariano De Giovanni Rodrigues, J. C. Galzerani et al. · Journal of Applied Physics · 2009 · 47 citations · Full text

Materials Science, Ii-vi Semiconductor, Gaasp/gap Core-shell Nanowires +11