H. Tsuno

Advanced Analysis and Modeling of MOSFET Characteristic Fluctuation Caused by Layout Variation

H. Tsuno, Kenichi Anzai, Masao Matsumura et al. · 2007 · 61 citations

Device Modeling, Gate Space Dependence, Electrical Engineering +15

Empirical Characteristics and Extraction of Overall Variations for 65-nm MOSFETs and Beyond

Michihiro Kanno, A. Shibuya, Masao Matsumura et al. · 2007 · 32 citations

Engineering, Vlsi Design, Mosfet Variations +16

65 nm CMOS technology (CMOS5) with high density embedded memories for broadband microprocessor applications

N. Yanagiya, Shôichi Matsuda, S. Inaba et al. · 2003 · 23 citations

Engineering, Vlsi Design, Computer Architecture +17

New guideline of Vdd and Vth scaling for 65nm technology and beyond

E. Morifuji, Takeshi Yoshida, H. Tsuno et al. · 2004 · 14 citations

Low-power Electronics, Electrical Engineering, Physical Design (Electronics) +13

High performance 30 nm bulk CMOS for 65 nm technology node (CMOS5)

E. Morifuji, M. Kanda, N. Yanagiya et al. · 2003 · 12 citations

Engineering, Vlsi Design, High Performance 30 +16