H. Tsuno

Advanced Analysis and Modeling of MOSFET Characteristic Fluctuation Caused by Layout Variation

H. Tsuno, Kenichi Anzai, Masao Matsumura et al. · 2007 · 61 citations

Engineering, Computer Engineering, Electrical Engineering +17

Empirical Characteristics and Extraction of Overall Variations for 65-nm MOSFETs and Beyond

Michihiro Kanno, A. Shibuya, Masao Matsumura et al. · 2007 · 33 citations

Engineering, Computer Engineering, Electrical Engineering +17

65 nm CMOS technology (CMOS5) with high density embedded memories for broadband microprocessor applications

N. Yanagiya, Shôichi Matsuda, S. Inaba et al. · 2003 · 23 citations

Engineering, Computer Engineering, Electrical Engineering +17

New guideline of Vdd and Vth scaling for 65nm technology and beyond

E. Morifuji, Takeshi Yoshida, H. Tsuno et al. · 2004 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +16

High performance 30 nm bulk CMOS for 65 nm technology node (CMOS5)

E. Morifuji, M. Kanda, N. Yanagiya et al. · 2003 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +17