Michihiro Kanno

Advanced Analysis and Modeling of MOSFET Characteristic Fluctuation Caused by Layout Variation

H. Tsuno, Kenichi Anzai, Masao Matsumura et al. · 2007 · 61 citations

Device Modeling, Gate Space Dependence, Electrical Engineering +15

18.1: A 0.23‐in. High‐Resolution OLED Microdisplay for Wearable Displays

Reo Asaki, Seiichi Yokoyama, Hideyuki Kitagawa et al. · SID Symposium Digest of Technical Papers · 2014 · 32 citations

High‐resolution Oled Microdisplay, Engineering, Display Technology +9

Empirical Characteristics and Extraction of Overall Variations for 65-nm MOSFETs and Beyond

Michihiro Kanno, A. Shibuya, Masao Matsumura et al. · 2007 · 32 citations

Engineering, Vlsi Design, Mosfet Variations +16

Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM-2200FS STEM/TEM

Masashi Watanabe, Michihiro Kanno, D Ackland et al. · Microscopy and Microanalysis · 2007 · 22 citations

Engineering, Microscopy, Ft. Lauderdale +19

Development of a 200kV Atomic Resolution Analytical Electron Microscope

Thomas Isabell, Jaap Brink, Masahiro Kawasaki et al. · Microscopy Today · 2009 · 12 citations

Optical Materials, Engineering, Microscopy +18