J.H. Evans–Freeman

Current transport mechanisms and deep level transient spectroscopy of Au/n-Si Schottky barrier diodes

J.H. Evans–Freeman, M.M. El-Nahass, A.A.M. Farag et al. · Microelectronic Engineering · 2011 · 33 citations

Electrical Engineering, Engineering, Physics +4

Laplace-transform deep-level transient spectroscopy studies of the G4 gold–hydrogen complex in silicon

P. Deixler, Jonathan G. Terry, I.D. Hawkins et al. · Applied Physics Letters · 1998 · 33 citations

Semiconductors, Gold Acceptor, Engineering +15

Hydrogen reactions with electron irradiation damage in silicon

А. R. Peaker, J.H. Evans–Freeman, P. Y. Y. Kan et al. · Physica B Condensed Matter · 1999 · 29 citations

Engineering, Hydrogen Transition, Applied Physics +4

High resolution electrical studies of vacancy-rich and interstitial-rich regions in ion-implanted silicon

N. Abdelgader, J.H. Evans–Freeman · Journal of Applied Physics · 2003 · 21 citations

Deep Electronic States, Engineering, Integrated Circuits +16

Optical and AFM study of electrostatically assembled films of CdS and ZnS colloid nanoparticles

Suryajaya, Alexei Nabok, Frank Davis et al. · Applied Surface Science · 2008 · 20 citations · Full text

Materials Science, Optical Materials, Engineering +10